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883.、1Definition
1.1Preconditioning TestingPCThe Surface Mount PreconditioningTest is used tomodel thesurfacemount assemblyconditions duringcomponent solderprocessing.Consistent with JEDEC JESD22-A113A TreconditioningProcedures ofPlasticSurfaceMountDevices Priorto ReliabilityTesting”,the devicesaresubjected tobake for24hrs,at125to baselinethe package℃moisture content,a controlledmoisture soakfor192hrs,at30/60%R.℃H.,followed by3thermal cyclesthrough areflow simulationtemperatureprofile.This preconditioningis consistentwithJEDECMoistureSensitivity Level3thermal packagemoisture sensitivityand dry-packstorage requirements.
1.2Temperature CyclingTCThe temperaturecycling test is intendedto assessthe productsability towithstandtemperature changesin afield usesituation suchas systemOn/Off temperaturechanges,night/day,and/or severestorage extremes.The test is used to determine the abilityof thecomponent andsolderinterconnects towithstand thermomechanicalstresses inducedbyalternating highand lowtemperature extremes.The testprocedurefollows thegeneral guidelineslisted inthe JEDECstandardJESD22-A104-B.Electrical testingat theinterim andfinal readpointsensures thatthe unitson testcontinue tomeet data sheet specifications.
1.3Highly AcceleratedStress TestHASTThe HASTtestis performed forthe purposeof evaluatingthe reliabilityofproducts inhumid environments.It isa highlyaccelerated testthatemploys temperature and humidityunder non-condensing conditionstoaccelerate thepenetration ofmoisture into the productintotheunderfill,substrate,etc..The testis usedto assessthe robustnessof the product,its mechanicalintegrity,the adhesionstrength betweeninterfaces,andsusceptibility tocorrosion inthe presenceof ioniccontaminants.The testprocedurefollows thegeneral guidelineslisted inthe JEDECstandardJESD22-A
118.The typicaltest parametersused are96hours at130/85%Relative HumidityRH.℃
1.4High TemperatureOperational LifeHTOLHTOL isusedtoaccelerate failuremechanisms whichmay beactivatedthrough elevatedoperational temperaturesand elevatedvoltage.Alldevices receivefull andstandard productionscreening priorto receivingHTOLstress.Full Electricaltestisperformed ateach readpoint toverifythat theproduct meetsdatasheetparameters.Early LifeEL isdefinedas thefirst4k hoursof field operation.Inherent LifeIL isdefined as26khrs offieldoperationin additiontothe4k EarlyLife fieldhours.The ILportionof thebath tubecurve isconstant failurerate indicatingtheintrinsic productreliability.Extended LifeXL isdefined as70k hrsoffield operation.This portionof thestress verifiesthat anywear outmechanismshave notbeen initiated.
1.5Electrostatic DischargeHuman BodyModelThis methodisusedto classifycomponents forESD susceptibilityfromhuman handlingand todeterminethelimits of theproductin anaverageproduction environmentwhen handledby humans.The dischargewaveformis intendedto approximatethe ESDevent froma humanfingertip toa pinofthe componentwhile otherpins areat groundpotential.
1.6Latch-Up TestLatch-up characteristicsare extremelyimportant indetermining productreliabilityand minimizingNo TroubleFoundNTF andElectricalOverstressEOS failuresdue tolatch-up.This testingisperformedtoassure aproduct doesnot entera latchup statewhen exposedtoover/under-voltage conditionson supplypins orover/under-current onsignalpins.
2.Product Reliability
2.1Pre-condition Testlevel IIIReferenceProcedure JEDED22-A113DTest ParameterSAM AnalysisFunction TestTestStructure Hi3511V110Vehicle Packagetype:BGA441℃
1.Baking24h at125;
2.Moisture soakingatthetemperatureandhumidity:Method℃30,60%RH,192h;℃
3.Reflowing solderIR at260and immersingin3x fluxfor10sec.Sample size154pcsPass/Fail JudgmentPass PCfunctional testA/R=0/1Test resultPass
2.2High AcceleratedStress TestReference ProcedureJEDED22-A110BTest ParameterFunction TestTestStructure Hi3511V110Vehicle Packagetype:BGA441℃Method HAST130/85%RH/96hrs,UnbiasSample size77pcsPass/Fail JudgmentPass HAST96hr functiontestA/R=0/1Test resultPass
2.3Temperature CyclingTestReferenceProcedureJEDED22-A104BTest ParameterSAM AnalysisFunction TestTest StructureHi3511V110Vehicle Packagetype:BGA441Method-40℃〜+115℃airto air,500cycleSample size77pcsPass/Fail JudgmentPass500cycle functiontestA/R=0/1Test resultPass
2.4High TemperatureOperation TestReferenceProcedureJEDED22-A104BTest ParameterFunctionTestTestStructureHi3511V110VehiclePackage type:BGA441℃Stress temperature=+125,1000hr,Dynamic biasedMethodReadpoints at168hrs/500hrs/1000hrsSample size77pcsPass/Fail JudgmentPass10OOhr functiontestA/R=0/1Test resultPass
2.5ESD-Human BodyModeReference ProcedureMIL-STD-883F Method
3015.7Test Parameterl-V CurveShiftTest StructureHi3511V110VehiclePackage type:BGA441Force Voltagefrom2000VMethodTest l-V curveofthetest chipSamplesize63pcsPass/Fail JudgmentFor Vchange at1uA±30%Test resultPass
2.6Latch-up TestReferenceProcedureJEDEC78MARCH1997Test ParameterTestthe currentof Vsupplybefore andafter triggerTestStructureHi3511V110Vehicle Packagetype:BGA441Method CurrentTrigger:±250mASample size9pcs25mA10mA+lnormalPass/Fail Judgment25mA
1.4x|normalTest resultPass。